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News

01/10/2020 | 152
Keysight Technologies Delivers High Speed Differential Probing Solution for DDR5/LPDDR5 Keysight Technologies, Inc. announced the MX0023A InfiniiMax RC, a new high speed differential probing solution for Double Data Rate 5 (DDR5) and Low Power Double Data Rate 5 (LPDDR5).

01/07/2020 | 124
NI Launches Electric Vehicle HIL Test Architecture National Instruments announced new solutions for hardware-in-the-loop (HIL) validation of electric vehicle (EV) powertrain components.

01/03/2020 | 113
Anritsu Introduces PCI Express Test Solution Supporting PCIe 5.0 Base Specification Rx Tests Anritsu Company introduces its new PCI Express test solution supporting the Gen5 Base Specification Stressed Receiver Test featuring the Signal Quality Analyzer-R MP1900A Series with installed Automation Software for base specification calibration and BER Measurement Software supporting the SKP Filter.

12/31/2019 | 214
Rohde & Schwarz and Vector win 2020 AVT ACES award for C-V2X test solution Each year, top companies in the areas of vehicle autonomy, connectivity, electrification, and mobility services are awarded by BNP Media’s print/digital magazine “Autonomous Vehicle Technology”. Rohde & Schwarz and Vector are amongst the winners in the category connectivity.

12/27/2019 | 184
Keysight First to Achieve 3GPP C-V2X Radio Frequency Conformance Test Case Validation Keysight Technologies, Inc. announced that the company achieved 3rd Generation Partnership Project (3GPP) validation of the industry's first cellular vehicle-to-everything communications (C-V2X) radio frequency (RF) conformance test case. As a result, Keysight is enabling the automotive industry to accelerate commercialization of connected cars and autonomous vehicles.

12/24/2019 | 149
New TI Burr-Brown™ audio ADC enables far-field voice capture at four times the distance Texas Instruments (TI) introduced a new audio analog-to-digital converter (ADC) capable of capturing clear audio up to four times farther away than competing devices. The TLV320ADC5140 is the industry’s smallest quad-channel audio ADC with this level of performance. The device is part of a new family of three TI Burr-Brown™ audio ADCs that enable low-distortion audio recordings in loud environments, along with far-field, high-fidelity recordings in any environment.

12/20/2019 | 139
NI Launches 4 GHz Vehicle Radar Test System National Instruments announced the release of its 4 GHz Vehicle Radar Test System (VRTS). Automotive radar is essential to vehicle safety for current advanced driver assistance systems (ADAS) and future autonomous driving. It’s one of the most widely used sensing technologies because it’s robust and readily available.

12/17/2019 | 190
Rohde & Schwarz enables the development of next generation automotive radar chips with new high-precision test chamber Rohde & Schwarz has developed the leading-edge R&S ATS1500C antenna test system, a test chamber for high performance radar testing, offering an outstanding indirect far-field testing performance. This innovation allowed Uhnder to mature the technology behind the first 4D digital automotive radar-on-chip with 192 virtual channels.

12/13/2019 | 188
Keysight, Sprint Collaborate to Accelerate Commercial Deployment of 5G Technology Keysight Technologies, Inc. announced that Sprint has selected Keysight's 5G network emulation solutions to validate the performance of 5G new radio (NR) mobile devices, accelerating U.S. 5G commercial deployment of fixed wireless access (FWA) and enhanced mobile broadband (eMBB) applications.

12/10/2019 | 117
Anritsu Launches Market-leading 116-Gbit/s PAM4 Error Detector For Evaluating 400 GbE and 800 GbE Transmissions Anritsu Company introduces a PAM4 Error Detector (ED) supporting market-leading 116-Gb/s bit error rate tests for its Signal Quality Analyzer-R MP1900A series. With the new module installed, the MP1900A is the only instrument to achieve error-free measurement of PAM4 signals at 116 Gbit/s with industry-best operation bit rates and high Rx sensitivity performance.


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#2 April 2020
KIPiS 2020 #2
Topic of the issue:
Modern instrumentation
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