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03.03.2010 | 1535
NI CompactRIO Controllers Offer Extended Operating Temperature Range of -40 to 70 Degrees Celsius National Instruments announced the release of two CompactRIO programmable automation controllers (PACs), which offer engineers and machine builders an ideal solution for high-performance measurement and control applications operating at extended temperatures. The NI cRIO-9023 and NI cRIO-9025 real-time controllers also are available with conformal coating for additional protection of components and circuitry within harsh conditions.

02.03.2010 | 1420
Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

25.02.2010 | 1752
Rohde&Schwarz autonomous mobile test system R&SŪROMES2GO R&S®ROMES2GO is a Rohde&Schwarz autonomous walk test system that automatically records quality of service (QoS) data in 3GPP mobile radio networks and stores it on the data card in the test mobile phone

24.02.2010 | 1527
Agilent Technologies Announces One-Box Solution for High-Speed Serial Interconnect Analysis Agilent Technologies introduced the Time Domain Reflectometer (TDR) application software option for the Agilent E5071C ENA network analyzer. The combined E5071C and TDR application software make the ideal one-box solution for high-speed serial interconnect analysis. The one-box solution is used by signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.

20.02.2010 | 1489
Compact EMC test solution provided by Rohde & Schwarz The new compact R&S® R-Line test chamber from Rohde & Schwarz combined with the R&SŪ TS8996 test system delivers an EMI/EMS test performance and accuracy for wireless devices that is comparable to that of systems 10 times larger. The R&SŪ R-Line fits into any lab and will significantly reduce infrastructure investments for manufacturers and test houses.

18.02.2010 | 1373
Agilent Technologies Delivers World's Most Accurate Handheld Vector Network Analyzer Agilent Technologies introduced the N9923A FieldFox RF Vector Network Analyzer (VNA) -- the world's most accurate handheld VNA. The FieldFox RF VNA provides the best measurement stability in the industry, 0.01 dB/degree Celsius, and offers the world's first integrated QuickCal calibration capability available in a handheld VNA. QuickCal enables consistent measurement results and confidence in the data while eliminating the need to carry a calibration kit into the field.

17.02.2010 | 1495
Yokogawa announces Reorganization of Measuring Instruments Business Yokogawa Electric Corporation announces that on April 1, 2010 it will reorganize its measuring instruments business by transferring its main product lines to Yokogawa Meters & Instruments Corporation.

16.02.2010 | 1665
Anritsu’s ME7873L LTE RF Conformance Test System Achieves World-First R&TTE verification Anritsu Corporation announced that its ME7873L LTE RF Conformance Test System has become the first in the world to provide independently verified European Radio equipment and Telecommunications Terminal Equipment (R&TTE) RF test cases for Type Approval of LTE devices.

15.02.2010 | 1406
Tektronix Spectrum Analyzer Makes Hot 100 List RSA6120A Spectrum Analyzer Chosen as a “Hot 100” Electronic Product of 2009 by EDN Magazine. The recognition honors the best products of the year for electronic design engineers that have advanced the state-of-the-art in electronics.

13.02.2010 | 1783
Rohde & Schwarz offer new options for signal and spectrum analyzer Two different optional pre-amplifiers are available for the R&S®FSV signal and spectrum analyzer. The options are designed especially for customers demanding maximum sensitivity for measuring the noise factor or very low-level signals, or for finding spurious emissions.

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Current issue
#6 December 2017
KIPiS 2017 #6
Topic of the issue:
Modern instrumentation