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Experimental estimate of the characteristics of semiconductor element performance using R&S RTO series oscilloscopes

The present article contains the ques-tion of the characteristics estimate of semiconductor element performance with further analysis of the appropriate methods. For this estimate there should be high quality equipment used especially when it concerns oscillography method. Rohde&Schwarz is ready to offer R&S RTO series oscilloscopes for these pur-poses. Find more details in the current article.

Author(s):  Lemeshko N., Strunin P.
Issue:  KIPiS 2015 #3

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Current issue
#4 August 2018
KIPiS 2018 #4
Topic of the issue:
Modern instrumentation
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