Modern test methods for fast switching RF/Microwave signal generation
This paper will discuss how this new Synthetic Instrument (SI) signal generator, comprising of an Arbitrary Waveform Generator (AWG) combined with a Vector Up-Converter can be used in all these applications without compromising performance or flexibility.
Author(s): John Stratton
Issue: KIPiS 2009 #6
Read PDF: Read
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2019|