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Instruments for microelectronics and nanotechnology

Instruments which successfully can be used in new fields of microelectronics and nanotechnology are considered in this article

Author(s):  Afonskiy, Alexander, Dyakonov V.
Issue:  KIPiS 2008 #5
Read PDF:  Read

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Current issue
#3 June 2020
KIPiS 2020 #3
Topic of the issue:
Metrology
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