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National Instruments Brings Semiconductor ATE Digital Capability to PXI

National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE).

Issue:  KIPiS 2016 #5

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Current issue
#6 December 2018
KIPiS 2018 #6
Topic of the issue:
Modern instrumentation
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