Metrology-2010. A brige to innovation
This article tells about two most important events for metrologists: The 6th International Competitive Exhibition of Measuring Tools, Testing and Laboratory Equipment «Metrology-2010» and the 2nd Moscow International Symposium of Metrologists devoted to the World Metrology Day.
Author(s): Kopteva, Natalia
Issue: KIPiS 2010 #3
Read PDF: Read
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2020|