RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

The mathematical theory of measurement problems: applications

The following interesting article written by professor Levin is devoted to the problems of Hubble diagram analysis under uncertainty conditions in respect to the research of red shift in the emission spectrum of extragalaxy source.


Author(s):  Levin S.
Issue:  KIPiS 2009 #6, KIPiS 2010 #1, KIPiS 2010 #2
Read PDF:  Read

Back to the list


Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search