RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Catastrophical Phenomenon of 1985-1986: Recurrence to the Past

In this article, the author continues to tell about the metrological aspects as well as the role of measurement errors in the “catastrophical phenomenon”.

Author(s):  Levin S.
Issue:  KIPiS 2007 #3, KIPiS 2007 #4
Read PDF:  Read

Back to the list


Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search