Semiconductor C-V characteristic measurement — choosing up-to-date low-cost solution

Semiconductor electrophysics of today can hardly be imagined without C-V characteristic measurement meaning the capacitance measurement as a function of the applied direct offset voltage. This very measurement allows quickly identifying the basic parameters of semiconductor and dielectric layers which direct measurement is considered a rather complicated process. You will find more details in the present article and also get to know about the use of AKTAKOM LCR analyzers for semiconductor C-V measurement.
Author(s):  Shumskiy I.
Issue:  KIPiS 2017 #2