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Semiconductor C-V characteristic measurement choosing up-to-date low-cost solution

Semiconductor electrophysics of today can hardly be imagined without C-V characteristic measurement meaning the capacitance measurement as a function of the applied direct offset voltage. This very measurement allows quickly identifying the basic parameters of semiconductor and dielectric layers which direct measurement is considered a rather complicated process. You will find more details in the present article and also get to know about the use of AKTAKOM LCR analyzers for semiconductor C-V measurement.

Author(s):  Shumskiy I.
Issue:  KIPiS 2017 #2

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Current issue
#2 April 2020
KIPiS 2020 #2
Topic of the issue:
Modern instrumentation
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