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Pulse testing principles for emerging non-volatile memory technologies

Emerging NVM materials and device types require electrical characterization that traditionally has not been available or required custom in-house test systems, which had limited capabilities. New instrumentation is now available that provides pulse sourcing with simultaneous measurement that permits characterization of the underlying switching behavior that is key to understanding NVM performance.

Author(s):  Hulbert, Peter J.
Issue:  KIPiS 2014 #1

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Current issue
#5 October 2019
KIPiS 2019 #5
Topic of the issue:
Modern instrumentation
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