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Multipoint measurement mode in AKTAKOM AMM-30x8 component analyzer series

The current article describes the application of the multipoint measurement mode (automatic range or step sweeping) in AKTAKOM AMM-30x8 component analyzer series which expands the capabilities of the device, including semiconductor structures analysis, increases the results reliability and reduces the time it takes for measurements.

Issue:  KIPiS 2020 #2

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Related Information:

Current issue
#4 August 2020
KIPiS 2020 #4
Topic of the issue:
Modern instrumentation
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