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Information

Weller, Dennis


Articles of this author


Component Testing Using an Oscilloscope with Integrated Waveform Generator

Issue: KIPiS 2011 #2

This article describes methods for testing components with an oscilloscope and signal generator. The technique is shown for the capacitors, inductors, diodes, bipolar transistors and wires testing. Furthermore, the described methods can be used to find faulty components or to determine nominal parameters of the unmarked components.

 

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
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