News from Anritsu(118)
News from Fluke(23)
News from Keithley(32)
News from Keysight Technologies(298)
News from Metrel(0)
News from National Instruments(143)
News from Pendulum(14)
News from Rigol(9)
News from Rohde & Schwarz(234)
News from Tektronix(137)
News from Texas Instruments(75)
News from Yokogawa(29)
Keithley Instruments
Keysight Technologies
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Texas Instruments
Forgot your password?

Lemeshko N.

Books of this author

Articles of this author

Pulsed phase noise measurements with R&S FSWP phase noise analyzer

Issue: KIPiS 2020 #3

The current article describes the issues of the phase noise measurements of pulsed modulation signals that are widely used in radio detection and location. The authors analyze the spectral features of such signals and theoretical limitations determined by the pulse operation mode; estimate the dependence of the noise parameters on the modulating pulses characteristics; consider the digital phase demodulation method with cross-correlation processing; describe the functional features of R&S FSWP analyzers. Also they describe the principle and example of pulse-modulated carrier signal processing in R&S FSWP analyzer as well as the example of measuring the amplitude and phase stability of pulsed-modulated signals.

State-of-the-art capabilities of jitter analysis in high-speed digital devices using R&S RTO-K12 option

Issue: KIPiS 2019 #2

The present article demonstrates the state-of-the-art capabilities of jitter analysis in high-speed digital devices by the example of R&S RTO-K12 option. The author suggests analyzing the reasons that may cause jitter, classification of its components and the main approaches to its reduction, as well as the typical consequences of this phenomenon appearance when operating digital devices. This article also demonstrates the existing methods of jitter analysis and shows examples of measurements using R&S RTO-K12 option to estimate temporal and statistical characteristics of digital signal jitter.

Radio interference search and analysis by using R&S FSH handheld spectrum analyzer

Issue: KIPiS 2015 #5

In the present article they consider the question of spectrum analyzers use when solving electromagnetic compatibility problem. Here you will find the analysis of the main tasks in the field of EMC and also read about the advantages of handheld spectrum analyzers comparing to the nonportable laboratory devices. In this article R&S FSH series spectrum analyzers are compared to the initial and average level devices which may help you to see the way they can replace each other when solving the described tasks.

Experimental estimate of the characteristics of semiconductor element performance using R&S RTO series oscilloscopes

Issue: KIPiS 2015 #3

Analysis of dynamic characteristics of loads and parameters of secondary power sources using oscilloscopes R&S RTO

Issue: KIPiS 2014 #6

The present article describes the use of oscillography in forming solutions for electrotechnical tasks including analysis of dynamic characteristics of secondary supply source loads and parameters. In this article you will read about the methods for analysis of dynamic characteristics, about the particularities of oscilloscope connection to electrotechnical circuits. Hereof you will get to know of the ability to use R&S RTO-K13 option for the analysis of power supply parameters. Also you will see the examples of this option use to measure the starting current and current harmonics.


Current issue
#3 June 2020
KIPiS 2020 #3
Topic of the issue: