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Morgan, Lee


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A new approach to frequency analysis on oscilloscopes

Issue: KIPiS 2019 #5

Debugging embedded systems often involves looking for clues that are hard to discover just by looking at one domain at a time. The ability to look at time and frequency domains simultaneously can offer important insights. To address the need for RF analysis in its 4, 5 and 6 Series MSO mixed signal oscilloscopes, Tektronix is taking a new approach that does not require a separate input channel. Recently released firmware unlocks an analysis tool called Spectrum View that takes advantage of patented hardware already in the instruments.

 

Current issue
#3 June 2020
KIPiS 2020 #3
Topic of the issue:
Metrology
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