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Morgan, Lee


Books of this author



Articles of this author


Finding relationships between power rail noise and jitter

Issue: KIPiS 2020 #5

To get to the root cause of bit errors, jitter analysis is the best starting point but in some cases power rail analysis can help get to the true root cause. To get to the bottom of bit errors, we look at jitter and power rail noise in both the time and frequency domains.

 
A new approach to frequency analysis on oscilloscopes

Issue: KIPiS 2019 #5

Debugging embedded systems often involves looking for clues that are hard to discover just by looking at one domain at a time. The ability to look at time and frequency domains simultaneously can offer important insights. To address the need for RF analysis in its 4, 5 and 6 Series MSO mixed signal oscilloscopes, Tektronix is taking a new approach that does not require a separate input channel. Recently released firmware unlocks an analysis tool called Spectrum View that takes advantage of patented hardware already in the instruments.

 

Current issue
#5 October 2020
KIPiS 2020 #5
Topic of the issue:
Modern instrumentation
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