Russian
News from Anritsu(104)
News from Fluke(23)
News from Keithley(30)
News from Keysight Technologies(269)
News from Metrel(0)
News from National Instruments(131)
News from Pendulum(14)
News from Rigol(6)
News from Rohde & Schwarz(205)
News from Tektronix(129)
News from Texas Instruments(64)
News from Yokogawa(25)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Strunin P.


Books of this author



Articles of this author


State-of-the-art capabilities of jitter analysis in high-speed digital devices using R&S RTO-K12 option

Issue: KIPiS 2019 #2

The present article demonstrates the state-of-the-art capabilities of jitter analysis in high-speed digital devices by the example of R&S RTO-K12 option. The author suggests analyzing the reasons that may cause jitter, classification of its components and the main approaches to its reduction, as well as the typical consequences of this phenomenon appearance when operating digital devices. This article also demonstrates the existing methods of jitter analysis and shows examples of measurements using R&S RTO-K12 option to estimate temporal and statistical characteristics of digital signal jitter.

 
Experimental estimate of the characteristics of semiconductor element performance using R&S RTO series oscilloscopes

Issue: KIPiS 2015 #3

 

Current issue
#3 June 2019
KIPiS 2019 #3
Topic of the issue:
Metrology
Search