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Shumskiy I.


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Articles of this author


Semiconductor C-V characteristic measurement choosing up-to-date low-cost solution

Issue: KIPiS 2017 #2

Semiconductor electrophysics of today can hardly be imagined without C-V characteristic measurement meaning the capacitance measurement as a function of the applied direct offset voltage. This very measurement allows quickly identifying the basic parameters of semiconductor and dielectric layers which direct measurement is considered a rather complicated process. You will find more details in the present article and also get to know about the use of AKTAKOM LCR analyzers for semiconductor C-V measurement.

 
Sampling in the digital oscilloscope

Issue: KIPiS 2016 #6

We keep on publishing a series of articles devoted to the main principles of choosing a digital oscilloscope for your measurement tasks. In the current article we would like to draw your attention to the sampling as the main characteristic of digital oscilloscopes, namely how the mode, number of digits and sampling rate affect the measurement results.

 
Digital oscilloscope inputs and outputs use for integration into the measuring system

Issue: KIPiS 2016 #5

Nowadays it’s quite common to use a digital oscilloscope jointly with other devices for complex measurements and further data processing within a measuring system. However to integrate an oscilloscope into the complex measuring system there are some other additional technical capabilities required besides data transferring to PC or the local network. The current article in a very detail demonstrates the main of such capabilities and gives you examples of oscilloscope operation within the complex systems.

 
Checking the heat-insulated floor operability with AKTAKOM megaohmmeters

Issue: KIPiS 2015 #3

 

Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
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