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|How to optimize linear distortion measurements with a signal analyzer
Issue: KIPiS 2016 #1
Traditional spectrum analyzer measurements of RF device performance are classically measurements of non-linear performance such as harmonics, Third Order Intercept (TOI) or input related spurious responses. A very common non-linear measurement that is made is the adjacent channel power measurement that determines the amount of power relative to the power in the channel that appears in adjacent channels. These types of measurements tend to predict how spectrally pure a given RF device will perform when multiple receivers or transmitters are present. Modern signal analyzers retain the ability to make these classic non-linear distortion type measurements as well as in-channel phase and flatness distortion-type measurements.