Russian
News from Anritsu(85)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(223)
News from Metrel(0)
News from National Instruments(106)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(161)
News from Tektronix(104)
News from Texas Instruments(44)
News from Yokogawa(23)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Nelson, Bob


Books of this author



Articles of this author


How to optimize linear distortion measurements with a signal analyzer

Issue: KIPiS 2016 #1

Traditional spectrum analyzer measurements of RF device performance are classically measurements of non-linear performance such as harmonics, Third Order Intercept (TOI) or input related spurious responses. A very common non-linear measurement that is made is the adjacent channel power measurement that determines the amount of power relative to the power in the channel that appears in adjacent channels. These types of measurements tend to predict how spectrally pure a given RF device will perform when multiple receivers or transmitters are present. Modern signal analyzers retain the ability to make these classic non-linear distortion type measurements as well as in-channel phase and flatness distortion-type measurements.

 

Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
Search