Russian
News from Anritsu(85)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(223)
News from Metrel(0)
News from National Instruments(106)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(161)
News from Tektronix(104)
News from Texas Instruments(44)
News from Yokogawa(23)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Akihiko Oginuma

Agilent Technologies

Books of this author



Articles of this author


Speed up your design verification process with frequency domain clock jitter analysis

Issue: KIPiS 2008 #4

 
Speed up your design verification process with frequency domain clock jitter analysis

Issue: KIPiS 2008 #4

The author reviews the role of reference clock and the effects of clock jitter on data jitter, and discusses a new measurement technique equipped with the Agilent E5001A Precision Clock Jitter Analysis Application running on the E5052B Signal Source Analyzer (SSA) that delivers unprecedented capabilities, ultra-low random jitter (RJ) measurement and real-time jitter spectrum analysis on both RJ and periodic jitter (PJ) components, allowing you to improve your design quality

 

Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
Search