Russian
News from Anritsu(85)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(223)
News from Metrel(0)
News from National Instruments(106)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(161)
News from Tektronix(104)
News from Texas Instruments(44)
News from Yokogawa(23)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Harnack, Jake

National Instruments

Books of this author



Articles of this author


Highly Parallel Wafer-Level-Reliability Systems with Modular SMUs

Issue: KIPiS 2016 #6

WLR systems, which have been around for decades, vary in both measurement capability and architecture. Specialized WLR systems may involve high-frequency ac or pulsed stimulus. However, most CMOS devices are tested with dc instruments such as source measure units (SMUs), which supply the necessary stress and measurement capability for collecting parametric data.

 

Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
Search