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Ireland, Dave

Ireland, Dave David Ireland has more than thirty years experience in test and measurement ranging from an engineering apprenticeship with Racal, where he gained his formal electronic engineering qualifications, to his current position at Tektronix, where he is the marketing manager of design and manufacturing at Tektronix Europe. He is widely recognized by embedded system engineers in Europe for his signal integrity articles and collaborative workshops on high-speed digital system design, test, and measurement.

Books of this author



Articles of this author


Fundamentals of oscilloscopes. Part 3. Basic Systems and Controls

Issue: KIPiS 2011 #1

The third and final article of the series of three articles on the basics of the oscillography is dedicated to the main controls and basic systems of the oscilloscope. This series provides an overview of oscilloscopes and is aimed at students and other professionals who get acquainted with this topic for the first time.

 
Fundamentals of oscilloscopes. Part 2. Choosing an oscilloscope

Issue: KIPiS 2010 #6

This is the second article in a series of three articles on the basics of the oscillography. The articles are aimed to familiarize students and beginner users of oscilloscopes with the operation principles of these devices. Digital oscilloscopes have great capabilities for studying and analysis of wide range of waveforms. The article provides an overview on different types of digital oscilloscopes and draws attention to some key factors that allow engineers to make a choice in favor of particular instrument depending on its application.

 
Fundamentals of oscilloscopes. Part 1. Using an oscilloscope to understand waveforms

Issue: KIPiS 2010 #5

This is the first in a series of three articles on the basics of the oscillography. The articles are aimed to familiarize students and beginner users of oscilloscopes with the operation principles of these devices. Current article tells about specifics of use their application in signal waveform analysis and determination of various parameters characterizing the shape of these signals.

 

Current issue
#5 October 2017
KIPiS 2017 #5
Topic of the issue:
Modern instrumentation
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