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Borovskaya M.


Books of this author



Articles of this author


12th Moscow International Innovative Forum «Precision Measurements — The Basis of Quality and Safety»

Issue: KIPiS 2016 #3

As usual May is marked with the outstanding event in the metrology world — 12th Moscow International Innovative Forum «Precision Measurements — The Basis of Quality and Safety» which was held on May 17-19. Within the Forum all of the visitors had a chance to attend 5 (!) exhibitions in one pavilion and also The First all-Russian Congress of Metrologists and Instrument Engineers. Find more details and learn what the leading specialists consider the crucial to solve the most important metrology questions.

 
Innovations at ElectronTechExpo and ExpoElectronica 2016

Issue: KIPiS 2016 #2

March 15 to 17 was the period of two great exhibitions held simultaneously in International exhibition centre Crocus Expo in Moscow. One of them is the 14th International exhibition of technologies, equipment and materials for the electronic and electrical industries Electron- TechExpo and the second one is the 19th International exhibition of electronic components, modules and systems ExpoElectronica. Exhibition area of both events is 17500 square meters and it is a unique place for visitors to find the necessary equipment that meets their requirements and for manufacturers to demonstrate the latest developments at their best. Read the current review for more details about these great shows.

 
10th International Exhibition Aerospace Testing Russia 2013 and All-Russian Scientific-Technical Conference «Metrological Support of Testing and Measurements in Aerospace Industry»

Issue: KIPiS 2013 #6

International Exhibition of Testing Equipment, Systems and Technologies of Aerospace Industry — Aerospace Testing Russia — is one of the key events for leading specialists representing knowledge- intensive industries. The exhibition was held on October 22-24 and managed to unite over 90 companies from 11 countries. Simultaneously with this exhibition there was one more new exhibition held named Industrial Testing & Control. Also there was two-day All-Russian Scientific- Technical Conference «Metrological Support of Testing and Measurements in Aerospace Industry» where more than 170 specialists of aerospace industry gathered to discuss the most crucial questions of this area.

 
Oscillography seminar from Agilent Technologies

Issue: KIPiS 2012 #3

On May 24 Agilent Technologies organized a special seminar named «Oscillography and digital analysis» where all of the visitors had a chance to see innovative devices of the company, hear about the advantages of the instruments lately released and even operate them. Agilent specialists demonstrated detailed presentations and were glad to answer any questions.

 

Current issue
#5 October 2017
KIPiS 2017 #5
Topic of the issue:
Modern instrumentation
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