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Hulbert, Peter J.

Hulbert, Peter J. Peter J. Hulbert is a product and applications development engineer for Keithley Instruments (Cleveland, Ohio), which is part of the Tektronix test and measurement portfolio. He holds a bachelor’s degree in physics from Washington State University. His career in measurement instrumentation has overlapped a good portion of the electromagnetic spectrum—from ionizing radiation to the far infrared.

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Pulse testing principles for emerging non-volatile memory technologies

Issue: KIPiS 2014 #1

Emerging NVM materials and device types require electrical characterization that traditionally has not been available or required custom in-house test systems, which had limited capabilities. New instrumentation is now available that provides pulse sourcing with simultaneous measurement that permits characterization of the underlying switching behavior that is key to understanding NVM performance.

 

Current issue
#5 October 2017
KIPiS 2017 #5
Topic of the issue:
Modern instrumentation
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