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04/23/2012 | 2626
Rohde & Schwarz adds WLAN signaling functions to its R&S CMW500 and R&S CMW270 multistandard test platforms To achieve optimal results, WLAN user equipment needs to be tested under realistic operating conditions. The R&S CMW500 wideband radio communication tester and the R&S CMW270 wireless connectivity tester now have new options for accomplishing this task: In signaling mode, they can emulate a WLAN access point in line with IEEE 802.11a/b/g/n.

04/18/2012 | 2237
Agilent Technologies Introduces Innovative Multi-Measurement Signal Analyzer Capability for Wireless R&D Agilent Technologies Inc. announced that an innovative, new multi-measurement capability is being added to its 89600 VSA software, enabling simultaneous signal analysis of multiple carriers and signal formats for more efficient testing and deeper signal insight in wireless test.

04/16/2012 | 2864
New Fluke Thermal Imagers Transform Market With Best-In-Class Focus and World-Renowned Ruggedness Fluke Corporation introduces five new infrared cameras with a broad range of powerful yet easy-to-use capabilities

04/11/2012 | 2224
New 4 GHz oscilloscope from Rohde & Schwarz delivers highest precision and acquisition rate in its class Rohde & Schwarz continues to systematically broaden its oscilloscope portfolio, adding a 4 GHz model to its R&S RTO high-performance oscilloscope family. Together, the new R&S RTO1044 and the R&S RT-ZD40 differential probe (4.5 GHz bandwidth) are a powerful solution for developing digital, analog and RF designs.

04/09/2012 | 1955
Agilent Technologies Announces the Industry's First High-Speed AXIe Digitizer for Large-Scale Applied Physics Agilent Technologies Inc. introduced the high-speed M9703A digitizer, the industry's first eight-channel, 12-bit digitizer that complies with the AXIe open standard. The AXIe digitizer is designed for use in large-scale applied physics applications.

04/04/2012 | 1859
Tektronix Delivers Thunderbolt™ Technology Test Solution Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced a comprehensive test solution for Thunderbolt technology. Thunderbolt is a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements.

03/27/2012 | 3046
Keithley Introduces High Voltage System SourceMeter® Instrument optimized for High Power Semiconductor Test Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter® family of high speed, precision source measurement units.

03/21/2012 | 2054
Agilent Technologies Introduces Precision Waveform Analyzer Module With Industry-Best Performance Agilent Technologies Inc. recently introduced a precision waveform analyzer for engineers involved in design verification and validation of high-speed electrical communications systems and components.

03/19/2012 | 1978
Tektronix to Provide First Automated Test Solution for MHL CTS 1.2 Integrated physical and protocol layer testing offers faster debug, analysis and MHL CTS 1.2 compliance testing.

03/14/2012 | 2114
Tektronix Announces Membership to MOST Cooperation Tektronix automated tools address MOST signal integrity challenges to shorten time to market development; presentation of Tektronix measurement solutions at MOST forum.


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#4 December 2021
KIPiS 2021 #4
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