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11/15/2010 | 2630
The webinar provides details on the various resistivity methods and techniques used to achieve optimal results. Participants will learn the fundamentals of making resistivity measurements on bulk materials. The methods vary depending on if the material is a conductor, an insulator, or a semiconductor. Live Broadcast at 15:00 Central European Time on Thursday, November 18, 2010.
11/01/2010 | 2431
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were recently awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties.
09/30/2010 | 2467
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments. By providing significantly higher command-to-connect speeds, these switch mainframes make faster test sequences and greater overall system throughput possible.
07/19/2010 | 2642
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.
07/06/2010 | 2449
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Understanding the Basics of Electrical Measurements” on Thursday, July 8, 2010.
05/19/2010 | 2318
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card. The card, which offers 448 single-pole matrix crosspoints, was designed for automated switch and measure applications that require multiple instrument connections as well as high crosspoint density and high speed.
04/28/2010 | 2451
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Fundamentals of Ultra-Fast I-V Device Characterization" on Thursday, April 29, 2010.
03/02/2010 | 2482
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.
02/01/2010 | 2511
“Test & Measuring World” names finalists for “Test of Time 2010”. Among the finalists is Keithley’s model 4200-SCS Semiconductor Characterization System.
12/08/2009 | 2202
Agilent Technologies Inc. and Keithley Instruments Inc. announced that the sale of substantially all of Keithley’s RF product line to Agilent is now complete.
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