Keysight Technologies Addresses 400G/PAM-4 Test Challenges at DesignCon 2017
01/20/2017Keysight Technologies, Inc. (NYSE: KEYS) announced it will exhibit its latest high-speed digital solutions at DesignCon 2017, Booth 725, Santa Clara Convention Center, Feb. 1-2. Keysight's technical experts and application engineers will demonstrate the most advanced design and test solutions, developed for solving today's most difficult high-speed digital measurement challenges. Keysight is proud to be the host sponsor of DesignCon 2017.
In addition, Keysight will deliver eight complimentary, 40-minute education workshop sessions led by Keysight industry experts. Topics include USB Type-C, signal and power integrity, 400G/PAM-4, PCIe4, DDR4/LPDDR4, data analytics and IBIS-AMI simulation basics. Keysight will make copies of the presentations and videos available following the show to everyone who registers at the Keysight booth.
Keysight will demonstrate the following solutions at its booth:
Keysight's Physical Layer Test System (PLTS) 2017 is a new software release and features PAM-4 eye diagrams, channel operating margin (COM) and a SCPI command interface for manufacturing automation applications.
Keysight will also demonstrate its new Digital Interconnect Test System Reference Solution, used to enable signal integrity characterization of multiport interconnect products.
Keysight service and support specialists will be available at the booth to answer questions about its accredited calibrations, technology refresh services, training and consulting offerings.
Additional information about the show is available at Keysight DesignCon 2017.
Company profile: Keysight Technologies
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