Keithley’s free technical online seminar on Bias Temperature Instability and State of the Art Measurement Methods
Keithley Instruments invites to take part in free technical online seminar “Fundamentals of BTI Bias Temperature Instability and State of the Art Measurement Methods”.
This seminar is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using Ultra-Fast I-V methods. Sign up now!
Date and time
Europe: Thursday, December 16, 2010
The first segment of the seminar examines the current theory of positive and negative BTI (PBTI and NBTI) mechanisms in ultra thin film transistors. The second segment addresses the measurement challenges and defines the best methods for Ultra-Fast I-V measurements for capturing both degradation and recovery characteristics.Those participating in this seminar will learn:
The 1-hour seminar is accompagnied by an interactive Q&A capability (during live broadcast) where you can ask the presenter questions for additional insight on this important topic.
This seminar is intended for those whose job requires performing semiconductor reliability characterization measurements. The material is particularly beneficial for students, technicians, engineers, and lab managers who are responsible for developing test systems and methodologies to address the need of ultra thin film transistor reliability.
About the Presenter
The seminar will be broadcasted over the internet and requires your registration prior to the event.
Register today to reserve your place for this invaluable seminar!
To register for this webcast seminar click here.
You will receive confirmation and log-in information prior to the event.
Company profile: Keithley Instruments
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