National Instruments Introduces PXI Express Module for High-Channel-Count Dynamic Signal Acquisition
National Instruments announced the NI PXIe-449x devices, the most flexible high-channel-count dynamic signal acquisition (DSA) modules NI has to offer. The modules provide AC/DC coupling both for sensor measurements with a microphone or accelerometer and voltage measurements from a tachometer or device under test, making it possible for engineers to use a single device for all their sound and vibration acquisition needs.
“We need scalable data acquisition hardware and software that yields accurate data efficiently,” said Michael James, vice president at Blue Ridge Research and Consulting. “Leveraging LabVIEW with the NI PXIe-449x DSA module fulfilled our needs by enabling us to customize our applications and perform real-time monitoring.”
The NI PXIe-449x modules feature a choice of 8 or 16 channels with 24-bit analog-to-digital converters (ADCs) per channel and 113 dB dynamic range. The large dynamic range minimizes the noise floor, making it easy to detect even the smallest vibration and acoustic signals. The NI PXIe-449x modules also provide software-selectable gains that help engineers configure gain on each channel for the best signal-to-noise ratio possible.
With the NI PXIe-449x modules, engineers can easily synchronize physical measurements of any type and correlate real-time events. The modules sync effortlessly with the NI SC Express family of data acquisition modules, which provide signal conditioning and connectivity ideal for temperature, strain and high-voltage acquisition. The ability to combine the modules makes the PXI platform ideal for structural test, design validation and other dynamic tests.
The NI PXIe-449x devices are also compatible with the NI Sound and Vibration Measurement Suite, an interactive software for quickly acquiring, analyzing and logging acoustic and vibration measurements. The suite includes the NI Sound and Vibration Assistant and NI LabVIEW analysis VIs. High-level, ready-to-run applications for performing nondestructive tests are included.
To learn more about solutions for prototyping and deploying sound and vibration analyzers visit www.ni.com/soundandvibration
Company profile: National Instruments
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2018|