Russian
News from Anritsu(85)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(223)
News from Metrel(0)
News from National Instruments(106)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(161)
News from Tektronix(104)
News from Texas Instruments(44)
News from Yokogawa(23)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

2010 Measurement Science Conference

2010 Measurement Science Conference

09.03.2010

Themed "Global Measurement: Economy & Technology," the 2010 MSC will be held March 22-26 at the Pasadena Convention Center, Pasadena, CA. MSC will feature topics of interest to the test; metrology and calibration; and precision measurement communities.

Participants from government, aerospace, medical, and environmental backgrounds will meet to share the most up-to-date information. 


The Measurement Science Conference was founded in 1970 to promote education and professionalism in the measurement sciences and other related disciplines. The conference is an annual event that provides an excellent forum for professionals from all industries & disciplines to come together in a common location to learn new skills, introduce measurement or business solutions, network, see the latest Measurement & Test Equipment, and most importantly support the continuing education that is so vital to the sustainment of the talent pool whom are our future educators and measurement specialists.

www.msc-conf.com




Start date:  03/22/2010
End date:  03/26/2010
Venue:  Pasadena Convention Center, Pasadena, California USA

Back to the list

Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
Search