IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been held annually since 1965. The Conference, whose general theme is The Support Systems Technology Conference, is held in varying cities around the US each fall. Administered by a standing Board of Directors, the Conference typically presents over 120- quality application-focused papers with over 250 Exhibits, all focused precisely on the current issues facing military automated test. Attendance ranges between 650 and 750 (paid) attendees, with an additional 1,000 to 1,200 exhibitor and spouse attendees.
Conference theme, "45 Years of Support Innovation – Moving Forward at the Speed of Light", reflects that 2010 marks the 45th year of AUTOTESTCON and how its technical program is focused on the future of automatic test. Attendees will have the opportunity to preview many new products from a wide variety of exhibitors, and to meet with senior military and aerospace leaders to discuss their future needs and expectations.
More information on www.autotestcon.com
Start date: 09/13/2010
End date: 09/16/2010
Venue: Orlando, Florida, USA
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2018|