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News for last month

20.02.2018 | 14
Tektronix Accelerates EMI/EMC Compliance Testing Tektronix, a leading worldwide provider of measurement solutions, introduced EMCVu, a new all-in-one solution for EMI/EMC pre-compliance testing and troubleshooting. In today's electronic design environment, about 50 percent of products fail electromagnetic compatibility (EMC) testing the first time. EMCVu gives engineers an accurate, convenient and cost-effective approach to determine if their product designs will pass EMC emission compliance testing on the first try.

16.02.2018 | 20
Keysight Technologies Receives Certification for eCall Test Emulator Software Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers, and governments accelerate innovation to connect and secure the world, announced that the Keysight E6951A public safety answering point (PSAP) emulator has been certified by NavCert GmbH. The E6951A is part of Keysight’s E6950A eCall Conformance Test Solution. The certification was awarded Dec. 18, 2017.

13.02.2018 | 26
Test Smarter With the Latest Enhancements to LabVIEW NXG National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a new release of LabVIEW NXG, the next generation of LabVIEW engineering system design software. Engineers can now test smarter with LabVIEW NXG - quickly set up your instruments, customize tests to your device specifications, and easily view results from any web browser, on any device.

06.02.2018 | 40
Germany’s broadcaster RTL II relies on monitoring and multiviewer solution from Rohde & Schwarz Pioneering German broadcaster, RTL II, has selected Rohde & Schwarz to provide state-of-the-art AV content monitoring and multiviewer facilities for its revolutionary new totally IP-based OTT playout.

30.01.2018 | 61
Keysight Technologies' New Third-Generation Parametric Test Solution Reduces Time-To-Market, Lowers Cost-Of-Test Keysight Technologies, Inc. announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically increasing.

26.01.2018 | 62
Tektronix Instruments Support First Data Transmission Through Terahertz Multiplexer Tektronix, a leading worldwide provider of measurement solutions, announced that its instruments played an important role in a technology demonstration that could one day enable the next generation of ultra-high bandwidth wireless communications links. In an article published in the journal Nature Communications, an international research team reported the first transmission of two real-time video signals through a terahertz multiplexer at an aggregate data rate of 50 gigabits per second, some100x faster than cellular networks.

23.01.2018 | 74
Anritsu Releases Software for MT8870A that Creates Industry’s First LTE Category M Turnkey Measurement Solution Anritsu Company introduces software packages for its Universal Wireless Test Set MT8870A that create the world’s first turnkey automated measurement solution for testing and evaluating RF TRx characteristics of up to four NB-IoT devices and modules.

Current issue
#1 February 2018
KIPiS 2018 #1
Topic of the issue:
Modern instrumentation
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