RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

NIWeek 2010 — efficiency of innovation with National Instruments’ designing tools

The 16-th Worldwide Graphical System Design Conference NIWeek 2010 attracted more than 3000 of the world’s brightest engineers, educators, and scientists. The Conference is held annually by National Instruments at Austin Convention Center (Austin, Texas, USA). From this overview you will learn the key topics of the event and of the most significant innovations presented.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander, Kopteva, Natalia
Issue:  KIPiS 2010 #5
Read PDF:  Read

Back to the list


Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search