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Information

KIPiS 2009 #3

KIPiS 2009 #3

Year: 2009
Issue: 3
Month: June
Topic of the issue: Metrology

Contents

News from AKTAKOM, Tektronix, National Instruments, Rohde&Schwarz

World Metrology Day 2009. Measurements in Commerce

State service of measures and scales of the Russian Federation from reform of Mendeleev to our time

Role of metrology in conditions of crisis

Accuracy gives rise to quality

Moscow. VVC. Metrology-2009

Agilent Technologies will become a leader on Russian market (the interview with Saleem Odeh, Vice President Agilent Technologies)

Configuring instruments network options

Wavelet transform math base application in power quality analyzers

R&S®FSH4 / FSH8: next generation of handheld spectrum analyzers

The metrology teaches the system approach, the analysis

The exhibition «ExpoElectronica 2009» has surpassed expectations of participants

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#4 December 2021
KIPiS 2021 #4

KIPiS 2021 #4

Topic of the issue:

Modern instrumentation

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