“T&MWorld” announce finalists for “Test of Time 2010”

02/01/2010

“Test & Measuring World” names finalists for “Test of Time 2010”. Among the finalists is Keithley’s model 4200-SCS Semiconductor Characterization System.

Keithley says the 4200-SCS has grown steadily in popularity since its introduction in 2000 because of the system's point-and-click test environment, onboard computing capability, and low-level (0.1-fA) measurement capability. The first configuration offered the advantage of an all-in-one-box solution for DC measurements of critical device characteristics in a semiconductor lab environment.

Ongoing enhancements have broadened both the standard feature set and configuration options (including C-V and pulse source/measurement hardware). Keithley incorporated these features into the 4200-SCS without forcing customers to discard their existing test hardware and begin again with newer (and costlier) configurations. The company says this commitment to cost-effective upgrades has expanded the 4200-SCS's applications, which now include semiconductor technology development and process integration, incoming inspection, failure analysis, device reliability and lifetime testing, nanotechnology and MEMs research, dielectric characterization, flash memory testing, pulse testing of III-V devices, Hall-effect and van der Pauw testing, device modeling, and solar-cell characterization.

See also other “Test of Time” finalists:

http://www.tmworld.com/article/441499-Test_of_Time_Finalists_2010.php

Company profile:  Keithley Instruments