NI Equips the Next Generation of Electronic Designers
NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the beta release of Multisim Live, a fully web-based schematic capture and circuit simulation tool powered by SPICE technology.
Featuring an interactive, web-based environment, Multisim Live is an extension of the desktop Multisim solution for discovering, exploring and analyzing circuit designs while on the go. Key features of the beta release include a rich collection of analog circuit simulation capabilities in the cloud, a fully responsive integrated UI to change circuit parameters while simulations are running and accurate SPICE models of components from leading semiconductor manufacturers.
Designed for professors teaching foundational circuit design concepts and students learning and rapidly investigating electronics, Multisim Live’s powerful analog circuit simulation capabilities allow students to quickly advance from theory to action. Students can study existing simulations and then create their own designs to share and collaborate with peers, educators and industry professionals in an integrated community. Multisim Live is also part of a complete hands-on education solution that includes the desktop edition of Multisim as well as student measurement devices like Analog Discovery and the NI Educational Laboratory Virtual Instrumentation Suite (NI ELVIS).
“Multisim Live exceeds my expectations of a modern teaching tool for electronics design. With a cloud database, interactive features on any device and no install, students have full access to really understand the theory before moving to a laboratory implementation,” said Ed Doering, professor at Rose-Hulman Institute of Technology.
Multisim Live is also suited for industry professionals designing circuits and electronics. It offers complementary circuit design and simulation capabilities to the desktop version of Multisim.
Company profile: National Instruments
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2021|