Russian
News from Anritsu(133)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(328)
News from Metrel(0)
News from National Instruments(143)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(266)
News from Tektronix(149)
News from Texas Instruments(84)
News from Yokogawa(37)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Tektronix delivers automated USB Type-C® compliance and debugging solutions

Tektronix delivers automated USB Type-C® compliance and debugging solutions

07/20/2021

To meet consumer demand for ever faster data downloads, from live streaming videos to global videoconferences, Tektronix, Inc. announced three new testing solutions to help drive the future of data transfers.

The new transmitter automated test solutions are designed to meet the demanding requirements of next-generation technologies for large, rapid data transfers and low-latency video displays. Tektronix USB4™, Thunderbolt™ 4 and DisplayPort™ 2.0 automated compliance and debugging solutions address the most common challenges design engineers face, including test time, signal integrity and Device Under Test (DUT) control. The solutions also boast physical layer electrical testing and characterization, which is crucial for designers to comply with the next-generation standards over the USB-C connector.

The new USB4 standard increases data transfer rates up to eight times faster than the USB 3.0 standard and delivers fast and secure 100W USB-C charging. DisplayPort 2.0 is set to triple data bandwidth performance compared to the DisplayPort 1.4 and includes 16K video resolution, higher refresh rates, and improved user experience with augmented/virtual reality (AR/VR) displays.

Find more details here.

www.tek.com


Company profile:  Tektronix

Back to the list


Related Information:

Current issue
#2 June 2021
KIPiS 2021 #2
Topic of the issue:
Modern instrumentation
Search