RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

KIPiS articles


Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2011 #3
In the previous issue of our magazine we talked about the release of four new series of AKTAKOM analog digital generators based on the technology of direct digital synthesis (DDS). Characteristics and features of three budget series models AHP- 1105, AHP-1110 and AHP-1115 were discussed. Current article tells about three other series of AKTAKOM DDS generators and their detailed characteristics.

Author(s):  Weller, Dennis
Issue:  KIPiS 2011 #2
This article describes methods for testing components with an oscilloscope and signal generator. The technique is shown for the capacitors, inductors, diodes, bipolar transistors and wires testing. Furthermore, the described methods can be used to find faulty components or to determine nominal parameters of the unmarked components.

Issue:  KIPiS 2011 #2
Twenty years ago oscilloscopes found a wide use not only in laboratories but also in the field. From that time portable devises became more lightweight, sturdy and comfortable to use in a difficult operating conditions, for example on a crane portal or in production plant environments. This article tells about new 4-channel portable oscilloscope by Fluke.

Author(s):  Assay, Brig
Issue:  KIPiS 2011 #1
The manufacturers’ opinion on what features are the most important when choosing an oscilloscope often differs. This article focuses on three of the hardware specifications of the oscilloscope: noise, jitter and bandwidth. These characteristics may affect the design margins of products under development and must be considered before buying an oscilloscope.

Issue:  KIPiS 2011 #1
Increasing production, complexity and functionality of different types of mobile wireless devices demands the expanding of traditional RF measuring instruments bandwidth. A clear understanding of the principles of traditional radio measuring instruments, as well as many limitations associated with their use, allows the majority of engineers to turn to an open software-defined modular architecture for the creation of the RF automated test systems. National Instruments has been developing T&M equipment in the PXI format for RF industry and offering complete measuring systems based on them for more than eight years.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2011 #1
AKTAKOM programmable electronic loads combine precision parameters setup and measurement with high functionality and remote control possibility that provides high efficiency of power supplies tests.

Author(s):  Ireland, Dave
Issue:  KIPiS 2011 #1
The third and final article of the series of three articles on the basics of the oscillography is dedicated to the main controls and basic systems of the oscilloscope. This series provides an overview of oscilloscopes and is aimed at students and other professionals who get acquainted with this topic for the first time.

Author(s):  Barnett, Bob Guido Schulze
Issue:  KIPiS 2010 #6KIPiS 2011 #1
All digital oscilloscopes are temporarily blind. During this blind time the user will miss critical signal events at his device under test. Thus, it is necessary to understand the impact of blind time to the measurement. This article explains the background of blind time and points out why a high acquisition rate is important. It furthermore explains the R&S RTO oscilloscope capabilities and how they help for faster debugging, measurement and analysis.

Issue:  KIPiS 2010 #6
The development of PXI standard has brought a new perspective on software-defined technologies and modular instruments for automated test systems. During the last decade, PXI has established itself as the standard for measurements automatization and T&M equipment market shifted significantly in the direction of modular platforms based on PXI. From this article the reader will learn about the PXI standard development and its architecture. National Instruments modular instruments and software are given as examples.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2010 #6
The automated processing of data recorded by handheld instruments has been based on data transfer via RS-232 for a long time, and often the simplified version of the protocol (only data transmission from the device) has been used. The current article describes a new solution — non-electrical quantities measuring devices with built-in recorder and the ability to transfer data without any special software used. For the first time this series of devices is represented in Russia under AKTAKOM brand name.

Author(s):  Ireland, Dave
Issue:  KIPiS 2010 #6
This is the second article in a series of three articles on the basics of the oscillography. The articles are aimed to familiarize students and beginner users of oscilloscopes with the operation principles of these devices. Digital oscilloscopes have great capabilities for studying and analysis of wide range of waveforms. The article provides an overview on different types of digital oscilloscopes and draws attention to some key factors that allow engineers to make a choice in favor of particular instrument depending on its application.

Author(s):  Wong, Sook-Hua
Issue:  KIPiS 2010 #6
Understanding power meter and sensor key specifications is vital for selecting the right equipment for power measurements. An often overlooked area is the DC or AC coupling characteristic of the power sensor. Choosing the wrong type of sensor can result in measurement inaccuracy and — or even worse, damage to the power sensor. This article compares the DC-coupled sensors to AC-coupled ones (also known as «DC-blocked» sensors). Several application examples are included to illustrate the key differences. The article concludes with choices of both DC-coupled and DC-blocked sensors from Agilent Technologies to suit the user’s application requirements.

Author(s):  Afonskiy, AlexanderSukhanov E.
Issue:  KIPiS 2010 #5
Digital oscilloscopes, unlike their analog counterpart, measure the input signal not continuous but at discrete moments of time. On the one hand the device should display the most accurate measurements, on the other — it is difficult to visually perceive the shape of signal displayed as just a set of dots. There is a need to «draw a continuous line on certain dots» but the question is: how to do this? This article tells about different methods of signal interpolation, their benefits and disadvantages.

Author(s):  Dove, Lewis
Issue:  KIPiS 2010 #5
The article tells about the innovative microcircuits production technology used in the new Agilent Infiniium 90000 XSeries oscilloscopes and Infiniimax III oscilloscope probes. Several high performance microcircuits are constructed using patented, Agilent Technologies proprietary, advanced thick film processes and design techniques. They are called Quick Film 3D Microcircuits and are fabricated using a relatively new class of thick film dielectrics.

Author(s):  Ireland, Dave
Issue:  KIPiS 2010 #5
This is the first in a series of three articles on the basics of the oscillography. The articles are aimed to familiarize students and beginner users of oscilloscopes with the operation principles of these devices. Current article tells about specifics of use their application in signal waveform analysis and determination of various parameters characterizing the shape of these signals.

Issue:  KIPiS 2010 #4
A current trend in increasing complexity of devises under test and in mutual penetration of technologies stimulates the increasing flexibility of testing systems. The use of programmable modular architecture allows to develop a test system that can adapt to changes of test objects over time while having long life cycle. This article presents the concept based on software configurable virtual measuring instruments, describes the variety of hardware platforms and software and reveals the properties of modular systems that makes them ideally suited for solving test automation problems.

Author(s):  Dyakonov V.
Issue:  KIPiS 2010 #4
Nowadays the generators of sinusoidal and pulse signals are widely used in various electronic, communication, radar, broadcasting and other devices. This article describes the use of digital spectrum analyzer for comprehensive testing and control of signal generators. As an example one of the most popular and relatively cheap digital spectrum analyzers AKTAKOM AKC-1301/1601 with the band frequencies from 9 kHz to 3/6 GHz is given.

Issue:  KIPiS 2010 #4
Oscilloscopes are used in almost every field of electronics today — from digital circuitry to power electronics and RF engineering. Rohde & Schwarz has designed and engineered its new R&S RTO family of oscilloscopes for speed and signal fidelity. This article describes the key features of the new series of oscilloscopes.

Author(s):  Afonskiy, AlexanderSukhanov E.
Issue:  KIPiS 2010 #4
Modern low-cost handheld devices often have interfaces for connection to a PC allowing to use them as a universal data recorder. Mostly in such devices RS-232 protocol and quite simple software are used. However, in modern computers, especially laptops, RS-232 interface is found less often and limited software functions do not allow to make a full use of measurement results. This article describes AKTAKOM ATT series — budget instrumentation for nonelectrical quantities which has multifunctional software and the capability to connect to a PC via USB-interface.

Issue:  KIPiS 2010 #1
Until recently, it was difficult to find a range of highly consistent and compatible signal analyzers that were equipped to track along with a product’s lifecycle. Now, Agilent’s X-Series signal analyzers PXA, CXA, MXA and EXA models enable seamless testing across the product lifecycle in a variety of industries and applications. Collectively, the X-Series analyzers can help RF and microwave engineers address applications in R&D, design validation and manufacturing.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search