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Measurements in a dynamic world (message from Stephen Patoray, Director of the BIML to World Metrology Day 2016)

Message from Stephen Patoray, Director of the BIML to World Metrology Day 2016

Issue:  KIPiS 2016 #3

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Current issue
#3 June 2019
KIPiS 2019 #3
Topic of the issue:
Metrology
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