News

Rohde & Schwarz is the first oscilloscope manufacturer to offer an integrated arbitrary waveform and pattern generator in the lab class. With the generator, all R&S RTO2000 and R&S RTE oscilloscopes can deliver test signals on two analog and eight digital channels, making it possible to test complex circuits in a minimum of space using a single instrument. Even fully automated compliance tests can be performed.

Keysight Technologies, Inc. announced the Keysight Test Platform 195 is the first and only test platform that includes RF NB-IoT and CAT-M validated test cases together in the Global Certification Forum (GCF).

National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the release of a new family of PXI arbitrary waveform generators with up to two channels and 80 MHz of analog bandwidth in a single slot, and a new 100 MHz, 8-channel oscilloscope that builds on NI’s expertise in high-density and software-designed instruments in PXI. Engineers can achieve high-performance signal generation and measure complex waveforms with these new low-cost, compact mixed-signal instruments in a modular form factor.

Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, introduced the TTR500 Series USB Vector Network Analyzer, adding to the growing Tektronix portfolio of disruptive USB-based RF test instruments. Like Tektronix' highly successful USB-based spectrum analyzers, the new TTR500 Series delivers an unmatched combination of low price and performance – 40 percent lower cost than alternatives capable of matching its 122 dB dynamic range and 6 GHz frequency range. It also includes advanced features including new VectorVu-PC analysis software and the only built-in bias tee for testing active devices in this category.

The R&S ELEKTRA EMI test software has been designed for easy and intuitive EMI measurements during product development. It supports EMI test receivers and spectrum analyzers from Rohde & Schwarz. Even development engineers or technicians who only occasionally use these instruments to measure electromagnetic interference are able to configure automated test sequences quickly, often right in the development lab, using GTEM cells or line impedance stabilization networks (LISN).

Keysight Technologies, Inc. announced that its cellular-IoT test solution was selected by China Telecom to help accelerate its Narrow-Band IoT (NB-IoT) chipset and module certification progress. Based on the E7515A UXM wireless test set, Keysight is the only all-in-one test platform vendor to support China Telecom's NB-IoT RF conformance test and power consumption verification.

National Instruments announced Karen Rapp is joining NI as its new chief financial officer (CFO) commencing on May 9. Rapp will oversee NI’s global Finance and IT organizations and report to Alex Davern, NI CEO.

TI combines lowest power loss and highest immunity isolation to help enable more robust, reliable industrial systems.

The new R&S RT-ZVC02/04 multichannel power probe can measure across large current and voltage ranges without having to switch ranges, making it possible to monitor the power consumption of chipsets, radio modules and wearables such as smartwatches. When used in combination with an R&S RTE or R&S RTO oscilloscope, the current drain can be clearly correlated with analog and digital control signals, enabling developers to optimize the battery life of such wearables and wireless devices early in the development cycle.

Tektronix, Inc., a leading worldwide provider of measurement solutions, introduced new optical modules for its DSA8300 sampling oscilloscope that feature the industry's highest mask test sensitivity and lowest noise along with new features that increase production capacity and improve yield for current 100G designs moving into production. The company also unveiled enhancements to its 400G test solution including IEEE Ethernet standard-driven Transmitter and Dispersion Eye Closure (TDECQ) PAM4 and related support measurements for optical testing.