Russian
News from Anritsu(85)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(222)
News from Metrel(0)
News from National Instruments(106)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(161)
News from Tektronix(104)
News from Texas Instruments(44)
News from Yokogawa(23)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

KIPiS articles


Issue:  KIPiS 2015 #2KIPiS 2015 #5KIPiS 2016 #3
The purpose of this article is to explain signal generators, their contribution to the measurement solution as a whole and their applications. Understanding the many types of signal generators and their capabilities is essential to your work as a researcher, engineer or technician. Selecting the right tool will make your job easier and will help you produce fast, reliable results.

Issue:  KIPiS 2015 #2

Issue:  KIPiS 2015 #2

Author(s):  Bogdanoff, Daniel
Issue:  KIPiS 2015 #2

Author(s):  Podolskiy A.
Issue:  KIPiS 2015 #2

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2015 #2

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2015 #2

Author(s):  Davidson, Scott
Issue:  KIPiS 2014 #2
With complexity on the rise, modern mixed signal designs are proving to be a worthy adversary to designers. Embedded design engineers are having to wear multiple hats in order to efficiently troubleshoot and debug the latest designs. Debugging today’s designs requires working in a mixed domain environment, from DC to RF, with analog and digital signals, and serial and parallel buses. That means a modern measuring device should be combined and needs to give designers a more comprehensive set of functions and features to support efficient verification and debugging of embedded designs. To meet this need Tektronix has developed a new integrated oscilloscope MDO3000 that combines 6(!) instruments in a single small, portable package able to provide insight into both time and frequency domains. Find more in the present article.

Issue:  KIPiS 2014 #2
Semiconductors have been widely used in different areas since long ago. Almost all electronic devices contain semiconductor electronic components such as diodes, thyristors and transistors etc. Therefore one of the important measurement tasks in demand is their automatic test and characteristics measurement. This measurement task can be easily and reasonably solved by Keithley 2400 and 2600 A/B series sourcemeters together with graphical environment Lab Tracer. Read about advantages of such system in the present article.

Author(s):  Lemeshko N.
Issue:  KIPiS 2014 #2
The present article introduces the method to measure absolute electric area of alternating pulses using math waveforms. There is a detailed analysis of the mostly used pulse measurement methods given within this article as well as the acceptability assessment for the specified parameter. From this article you will get to know about the necessary requirements to oscilloscopes for this measurement type and see measurement examples of complex signals received using R&S RTM series oscilloscope.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2014 #2
As we already informed in one of our previous KIPiS issues (namely đ6, 2013) RIGOL Technologies, Inc. introduced many innovative products at international Hong Kong Electronics Fair in October 2013. Last time we prepared a special article about DS1000Z digital oscilloscopes. This time we’d like to introduce a detailed review of new Rigol DG1000Z digital signal generators and DSG3000 RF signal generators. Full and informative description of specifications and advantages — all of this can be found in the present article.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2014 #2
Why are there special instruments or additional probes needed for measurements with an oscilloscope in 220V network? This topic seems to be rather well-known. But often users chose a wrong oscilloscope for this kind of measurement and it’s a typical mistake. The present article introduces a solution for this measurement task.

Issue:  KIPiS 2013 #2
This article describes challenges of measurement in industrial applications using wireless measuring devices. The main attention is devoted to consideration of the wireless system Fluke ® CNX — the first tool for test and measurement, capable for wireless communication with multiple measurement modules.

Author(s):  Stauffer, Lee
Issue:  KIPiS 2013 #2
The recent drive toward greater energy efficiency has created an increasing demand for better high power semiconductor devices such as diodes, FETs, IGBTs and others. New technologies hold the promise of higher performance, including lower ON-state losses, lower OFF-state leakage, faster switching, and reduced loss while switching. However, along with the improved performance of these devices, characterization and measurements are becoming more complex and difficult. This article addresses a typical workflow in the design and development of a power semiconductor device, and discusses some of the equipment and measurement challenges associated with them.

Issue:  KIPiS 2013 #2
The article describes the purpose of the vector network analyzers and contains the information about features of the new VNA PXIe-5632 including the overview of the NI PXIe-5632, the mixer measurements, the intermodulation measurements, and the calibration function. The article also describes the advantages of dual-source architecture in terms of the new NI PXIe-5632.

Issue:  KIPiS 2013 #2
This article discusses the Agilent PXA’s technical innovations and the resulting benefits to those who need realtime RF signal analysis. It explains and discusses real-time analysis in concise terms and describes applications for the real-time PXA.

Author(s):  Ruiz, Rafael Hellwig, Mathias
Issue:  KIPiS 2013 #2
This article presents the I/Q Software Interface (R&S® K11 option) of the R&SŪRTO in the context of remote applications. It demonstrates the basic operation, application examples, and an analysis in MATLABŪ.

Issue:  KIPiS 2012 #3
This application note explains how to synchronize the signals from multiple R&S® SMBV100A vector signal generators in time.

Author(s):  Hayes, Maryjane
Issue:  KIPiS 2012 #2
This article discusses an application for your oscilloscope that can allow you to more efficiently use the memory while speeding up your debug time by targeting only the areas of interest in the signal. With segmented memory, the scope’s acquisition memory is divided into multiple smaller memory segments. This enables your scope to capture up to thousands of successive single-shot waveforms with a very fast re-arm time - without missing any important signal information.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2012 #2
In 2010 we published various articles about a new generation of programmable power supplies. In 2012 this group of devices has updated. There have come three groups of laboratory programmable power supplies. You may divide them in those which belong to the class of multi-functional professional laboratory power supplies with very low setting error level of current and voltage, and also budget devices based on new technical principles. All of these AKTAKOM APS7xxx series laboratory programmable power supplies have the same function, they are capable of being controlled via PC remotely with the help of AKTAKOM Power Manager software. Read about the functions of devices and this software in the present article in more detail.


Current issue
#4 August 2017
KIPiS 2017 #4
Topic of the issue:
Modern instrumentation
Search