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KIPiS articles

Author(s):  Levin S.
Issue:  KIPiS 2020 #4
Accumulated experience in measuring instruments calibration taking into account inadequacy errors has made it possible to identify an essential factor of the «dead end» in cosmology. But strictly speaking there is no «dead end». There is usual discordance of mathematical models built basing on measurement data from various sources aggravated by violations of the conditions for statistical methods applicability when inadequacy errors of mathematical models can be no longer neglected.

Author(s):  Afonskaya, Tatiana Afonskiy, AlexanderBorovskaya M.
Issue:  KIPiS 2020 #4
The Consumer Technology Association (CTA)® announced CES 2021® — January 6-9, 2021 — will be an all-digital experience connecting exhibitors, customers, thought leaders and media from around the world. The new format will allow participants to hear from technology innovators, see cutting-edge technologies and the latest product launches, and engage with global brands and startups from around the world.

Issue:  KIPiS 2020 #4
High-speed digital, wireless, aerospace and defense, and automotive companies need integrated active and passive components for devices such as cell phones, satellite communications, and 5G base stations, to increase performance and reduce size of end products. These highly integrated devices require highly integrated test solutions that address radio frequency (RF) test challenges while providing advanced functionality and performance. Keysight’s E5080B, P50xxA Series, and M980xA Series network analyzers deliver next generation features and performance in benchtop, USB and PXI form factors. These analyzers combine built-in pulse generators and modulators, spectrum analysis and time domain analysis in a single instrument to save time by fully characterizing modern devices without the need for additional test hardware.

Author(s):  Vinci, Andrea
Issue:  KIPiS 2020 #4
The Semiconductor Industry is always searching for new special materials, dielectric solutions and new device geometries for scaling down the device size further and further. Lateral and vertical heterostructures of 2D materials for instance have led to new revolutionary tiny and low power electronics. It’s the typical problem of electrical characterization in the low current range: the need to identify the attainable device performance under different conditions for low power / low leakage currents MOSFETs. The problem is practically solved by using a certain number of source measure units (SMUs), special instruments capable of sourcing current or voltage while measuring both current and voltage.

Author(s):  Bogachenkov D.Lemeshko N.Rakhmanov I.
Issue:  KIPiS 2020 #4
In the present article based on the purpose analysis of the transceiver modules and their typical structural diagram the authors have identified the typical EMC problems for which characteristics they may use the typical indicators. Basing on the operating modes of the transceiver modules, which corresponds to the highest noise emission and the lowest noise immunity, the authors suggest the general schemes for measuring the above EMC indicators using Rohde & Schwarz solutions and consider the key points in terms of preparation for such measurements.

Issue:  KIPiS 2020 #4
In the present article you will find the detailed information about AM-7113 multimeter-process calibrator as well as the description of the unique functional capabilities of this calibrator (standard and arbitrary waveform generation, electronic load imitation mode, etc.). Also you will be able to check the comparison table introducing the main technical characteristics of AKTAKOM multimeters- calibrators.

Author(s):  Lemeshko N.Rumyantsev K.
Issue:  KIPiS 2020 #3
The current article describes the issues of the phase noise measurements of pulsed modulation signals that are widely used in radio detection and location. The authors analyze the spectral features of such signals and theoretical limitations determined by the pulse operation mode; estimate the dependence of the noise parameters on the modulating pulses characteristics; consider the digital phase demodulation method with cross-correlation processing; describe the functional features of R&S FSWP analyzers. Also they describe the principle and example of pulse-modulated carrier signal processing in R&S FSWP analyzer as well as the example of measuring the amplitude and phase stability of pulsed-modulated signals.

Issue:  KIPiS 2020 #3
When a drone is operating where it shouldn’t, the potential ramifications can be catastrophic. As a result, organizations need real-time and accurate solutions for detecting drones flying in or near restricted airspace. In this article, we’ll discuss considerations when looking for a drone detection solution.

Issue:  KIPiS 2020 #3
The present article describes the capabilities of devices necessary for electrical laboratories for testing and measuring work. It should be considered that all types of work proceeded by electrical laboratories are «inthe- field» ones. That means the devices used should meet the following requirements: enhanced functionality, high measurement accuracy, reliability, impact resistance, and one of the most important requirement is the availability of Type Approval Certificate in Russian Federation which allows using such equipment in the field of metrological control and supervision. The current article will provide the examples of devices, convenient and multifunctional, that meet all of the requirements of electrical laboratories.

Issue:  KIPiS 2020 #3
The present article introduces new AKTAKOM APS-4215 and APS-4220 AC power supplies. Here you will find more details about the technical characteristics of these new devices as well as their functional capabilities which may significantly increase their popularity as multifunctional laboratory power supplies.

Issue:  KIPiS 2020 #3
2020 has caused many changes in all spheres of live. The majority of events and conferences earlier planned for this year have to be postponed for 2021. Nevertheless Rosstandart and other organizations decided to hold MetrolExpo conference but in absolutely new online format. This event got name Metrol- LIVE and was held on May 20 when the whole world was celebrating World Metrology day. Digitalization and its influence on the metrology, possible results and future prospects connected therewith became the main topics. Also it was followed by the skills contest for students where they could share their knowledge and master their skills in metrology industry.

Author(s):  Levin S.
Issue:  KIPiS 2020 #3
On September 1, 2019 ISO/IEC 17025–2019 came into force. This standard describes the general competence requirements for testing and calibration laboratories. In the present article professor S. Levin unites catastrophic historical facts, risk management analysis and this standard and considers whether this interconnection is actually possible and correct.

Author(s):  Levin S.
Issue:  KIPiS 2020 #2
Metrology is a fundamental science about the methods and means to reflect the physical objects nature with the help of mathematical models. And for metrology the problem of inadequacy has always been the central one. The present article by Professor S. Levin keeps very interesting centuries-old history facts that will help you to better understand this problem.

Issue:  KIPiS 2020 #2
The theme for World Metrology Day 2020 is Measurements for global trade. And this theme was chosen to create awareness of the important role measurement plays in facilitating fair global trade, ensuring products meet standards and regulations, and satisfying customer quality expectations. Indeed more widely metrology, the science of measurement, plays a central role in scientific discovery and innovation, industrial manufacturing and international trade, in improving the quality of life and in protecting the global environment. Read the following message from Martin Milton (Director of the BIPM) and Anthony Donnellan (Director of the BIML) to World Metrology Day 2020 and get to know their opinion about the important role of precise measurements and metrology for global trade affairs.

Author(s):  Maxwell, Matthew
Issue:  KIPiS 2020 #2
In the age of IoT, with ubiquitous wireless connectivity, meeting EMC requirements for any standard is becoming more difficult and time consuming. This article describes implementing a precompliance test with typical benchtop equipment, such as digital oscilloscopes.

Issue:  KIPiS 2020 #2
Our cars are becoming «connected» to information networks and increasingly dependent on wireless communication channels. And at the same time the number of on-board computing systems is rapidly growing. Like any high-speed and complex digital electronic system automotive electronics can be a source of electromagnetic interference and at the same time have great sensitivity to this interference. This article is dedicated to the discussion of electromagnetic interference (EMI) sources and the steps that engineers can take to identify, localize, and reduce their effects. The present article describes a device capable of measuring EMI characteristics with high accuracy — this is PXE EMI receiver by Keysight Technologies.

Issue:  KIPiS 2020 #2
AKTAKOM universal measuring devices are widely used in almost all kinds of spheres especially in service and repair due to their capability of combining multifunctionality, affordable price and high measurement accuracy. The present article describes the characteristics and functional capabilities of the most popular combined AKTAKOM models, provides the examples of their application for a wide range of measurement tasks.

Issue:  KIPiS 2020 #2
The current article describes the application of the multipoint measurement mode (automatic range or step sweeping) in AKTAKOM AMM-30x8 component analyzer series which expands the capabilities of the device, including semiconductor structures analysis, increases the results reliability and reduces the time it takes for measurements.

Author(s):  Afonskaya, Tatiana Afonskiy, AlexanderBorovskaya M.
Issue:  KIPiS 2020 #1
CES is the world’s gathering place for all those who thrive on the business of consumer technologies. It has served as the proving ground for innovators and breakthrough technologies for 50 years — the global stage where next-generation innovations are introduced to the marketplace. CES 2020 was held on January 7-10 with two additional special Media days organized on January 5 and 6 before the official show opening. From this very article you will get to know about the unique innovative devices you’ve never heard of before.

Issue:  KIPiS 2020 #1
This year AKTAKOM trade mark celebrates its 20th anniversary! The present article will tell you about the development and achievements of AKTAKOM, it will give you the answer to the main question — why AKTAKOM TM after so many years of existence truly stays the most popular and much-in-demand in Russia and CIS countries in the field of test and measuring equipment as well as industrial furniture.

Current issue
#4 August 2020
KIPiS 2020 #4
Topic of the issue:
Modern instrumentation