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Physical integration of oscilloscopes and function/arbitrary waveform generators can yield a new methodology for testing your designs

Looking back we may notice that in 1990 the integration of analog and digital analysis methods changed the diagnosis technology of embedded systems. In 2000 the addition of serial protocols led to a new revolutionary breakthrough that means protocol-aware hardware test. The current decade has demonstrated the following achievement — the simplification of waveform generation and response measurement. Therefore it’s possible to suggest that physical integration of oscilloscopes and standard/arbitrary waveform generators can become the basis of new testing methodology. Find more details in the present article.

Issue:  KIPiS 2012 #1

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Current issue
#6 December 2018
KIPiS 2018 #6
Topic of the issue:
Modern instrumentation
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