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Addressing the challenges of multiport and multi-site test

When selecting your VNA test solution for multiport devices, you need to consider switch loss, system calibration and other factors affecting test throughput and accuracy. Advances in test and measurement technologies have enabled multiport and multi-site test solutions to better address these challenges by increasing the number of measurements, the number of devices and measurement speed, while maintaining high accuracy and stability.

Author(s):  Hirato, Takuya
Issue:  KIPiS 2017 #5

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Current issue
#1 February 2018
KIPiS 2018 #1
Topic of the issue:
Modern instrumentation
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