New Keithley KickStart 2.0 Software Removes Complexity from Multi-Instrument Setup, Fast Data Visualization
07/20/2018 | 44Tektronix, Inc., a leading worldwide provider of measurement solutions, introduced Keithley KickStart 2.0 software that accelerates the path to results and enables quick test set-up and data visualization when using single or multiple instruments. KickStart simplifies what users need to know about instruments so that in just minutes engineers can take instruments out of the box and start gathering real data, complete with plots and quick statistical summaries.
08/26/2013 | 1637The new Keithley Model 2450 Touchscreen Source Measure Unit (SMU) Instrument is ideal for I-V functional test and characterization of a wide range of today's modern electronic devices, including scaled semiconductors, nano-scale devices and materials, organic /printed electronics and other current and voltage testing applications.
Keithley Introduces High Voltage System SourceMeter® Instrument optimized for High Power Semiconductor Test
03/27/2012 | 1987Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter® family of high speed, precision source measurement units.
02/29/2012 | 1994This web seminar will explain the basics of how SMU instruments work, describe key features and capabilities to consider for selecting an SMU instrument, and compare the actual performance of different SMU instruments in "real-world" applications.
01/26/2012 | 1807This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements.
Free Technical Online Seminar. Meeting the Electrical Measurement Demands of High Power High Brightness LEDs
12/14/2011 | 1720Keithley Instruments invites to attend an online seminar which provides an overview of the electrical test equipment that is required to properly test today’s High Power High Brightness LEDs.
10/10/2011 | 1831Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced the availability of five new general-purpose programmable DC power supplies designed to complement the company's existing line of specialty power supplies and source measurement instruments for component, module, and device characterization and test applications.
Keithley Expands Series 2400 SourceMeter® Family with Lower-Cost Solution Optimized for Low Voltage Testing
09/30/2011 | 1899Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced a low-cost addition to its popular Series 2400 SourceMeter® instrument family.
07/25/2011 | 1536Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.
06/27/2011 | 1587Keithley Instruments invites to join for a webcast seminar and discuss the different measurement techniques that can be used to characterize solar cells and other photovoltaic devices. The seminar will run at Thursday, June 30, 2011.
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2018|