Russian
News from Anritsu(86)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(225)
News from Metrel(0)
News from National Instruments(107)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(164)
News from Tektronix(106)
News from Texas Instruments(44)
News from Yokogawa(24)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Rohde & Schwarz presents growing oscilloscope portfolio at embedded world 2015

Rohde & Schwarz presents growing oscilloscope portfolio at embedded world 2015

12.01.2015

Rohde & Schwarz is continuously enhancing its oscilloscope portfolio with new models, applications and accessories, and visitors to the company's booth at embedded world 2015 in Nuremberg will have an opportunity to see this for themselves.

High definition oscilloscopes for signal analysis with 16 bit vertical resolution

The high definition mode increases the vertical resolution of the R&S RTO and R&S RTE digital oscilloscopes to up to 16 bits – a 256 fold improvement over the 8 bit resolution available in standard mode. To achieve this higher resolution, the signal is lowpass-filtered directly after the A/D converter. The digital filter reduces the noise, while increasing the signal-to-noise ratio. The higher resolution leads to sharper waveforms, showing signal details that would otherwise be masked by noise.

Segmented memory, digital voltmeter and frequency counter for the R&S RTM

Rohde & Schwarz has added a new model with 200 MHz bandwidth to its R&S RTM bench oscilloscope family. The history and segmented memory option, which expands the maximum memory depth to an unprecedented 460 Msample per channel, is available for all bandwidth models. This deep, segmented memory is especially beneficial for seamless analysis of data sequences with long rest periods such as pulsed signals and serial I2C bus data packets. The digital voltmeter option is also new. It enables the R&S RTM to measure various values such as AC, DC, peak and crest factor with three digit accuracy regardless of the oscilloscope's triggering. The scope now features a seven digit frequency counter as well.

New applications for the R&S RTO and R&S RTE oscilloscope families

The multiple triggering and decoding as well as compliance test options from Rohde & Schwarz support a broad range of users in design verification, commissioning, debugging and compliance testing. The R&S RTE and R&S RTO oscilloscope series offer users in the automotive market triggering and decoding analysis solutions for the high speed CAN flexible data (CAN-FD) bus protocol. An option for the R&S RTO supports compliance tests of automotive BroadR-Reach Ethernet interfaces. For mobile communications and embedded designs, Rohde & Schwarz recently enhanced the capabilities of the R&S RTO by adding two new options for analyzing MIPI RFFE and USB 1.0/1.1/ 2.0 interfaces. Another innovation is the automated MIPI D-PHY compliance test option for developers of smartphone components and wireless devices with MIPI D PHY implementation.

R&S HMO1002 mixed signal oscilloscope with exceptional features

Fanless operation, 1 Msample memory depth and a realtime sampling rate of 1 Gsample/s are the key features of the new entry level R&S HMO1002 mixed signal oscilloscope from Rohde & Schwarz. With a vertical sensitivity of 1 mV/div and integrated 128k point FFT, it performs far above standard scopes in this price segment. The R&S HMO1002 enables users to benefit from many practical features such as a pattern generator for embedded developers, an integrated digital voltmeter for service and maintenance technicians and special functions for the education sector.

Rohde & Schwarz will present its entire portfolio of oscilloscopes at embedded world 2015 in Nuremberg in hall 4, booth 4-218.

www.rohde-schwarz.com


Company profile:  Rohde & Schwarz

Back to the list


Related Information:

Current issue
#5 October 2017
KIPiS 2017 #5
Topic of the issue:
Modern instrumentation
Search