Russian
News from Anritsu(88)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(232)
News from Metrel(0)
News from National Instruments(111)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(169)
News from Tektronix(108)
News from Texas Instruments(47)
News from Yokogawa(24)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

Agilent Technologies Introduces High-Precision Pulse Function Arbitrary Noise Generator for Testing Higher Speed, Higher Bandwidth Devices

Agilent Technologies Introduces High-Precision Pulse Function Arbitrary Noise Generator for Testing Higher Speed, Higher Bandwidth Devices

16.02.2011

Agilent Technologies Inc. (NYSE: A) expanded its pulse function arbitrary noise generator family to help R&D and test engineers test higher speed, higher bandwidth analog, digital and mixed-signal devices more efficiently and with greater precision.

Design and test engineers are under pressure to get products to market faster, with shorter design schedules and yet higher quality goals. In addition, they must differentiate their products in the marketplace by offering unique capabilities, which necessitates expanded test functionality during development. The Agilent 81160A pulse function arbitrary noise generator provides innovative functionality and streamlined setup to help engineers complete a broader test set more quickly.

The Agilent 81160A pulse function arbitrary noise generator eliminates the need for cumbersome multi-instrument setups for stress testing devices. Like the 81150A, the 81160A provides versatile waveforms along with superior signals with an intrinsic jitter of 7 ps rms. This combination of characteristics helps engineers define better performance specifications for their devices. The 81160A is ideal for general-purpose bench tests and advanced serial data stress tests.

Capabilities include:

  • generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution;
  • selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards;
  • glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and
  • arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits.

"We are designing test tools that help engineers do their jobs as efficiently and effectively as possible," said Jürgen Beck, general manager of Agilent's Digital and Photonic Test product line. "All of our pulse pattern generators offer innovative features to accelerate test for device design."

Agilent demonstrated the new 81160A pulse function arbitrary noise generator at DesignCon 2011, Feb. 1-2, Santa Clara Convention Center.

The 81160A pulse function arbitrary noise generator will be available in March 2011.

Additional information is available at www.agilent.com/find/81160.

Agilent Technologies
www.agilent.com


Company profile:  Keysight Technologies

Back to the list


Related Information:

Current issue
#6 December 2017
KIPiS 2017 #6
Topic of the issue:
Modern instrumentation
Search