Agilent Technologies Introduces Fast, Accurate LCR Meter for Testing High-Frequency Passive Components
Agilent Technologies Inc. (NYSE: A) introduced the E4982A LCR meter, the newest addition to its LCR family of meters. The Agilent E4982A delivers the best performance for manufacturing passive components such as SMD inductors and EMI filters, where impedance testing at frequencies of 1 MHz to 3 GHz is required. The E4982A's powerful list measurements make it suitable for R&D and quality assurance.
Makers of chip inductor/EMI filters and integrators of chip inductor/EMI filter test systems are driven by the need for accurate and repeatable inductance, quality factor and impedance measurements. They are also under continual pressure to improve throughput and test yield while keeping test costs low. The Agilent E4982A offers 0.8 percent basic impedance measurement accuracy and repeatable measurements with small measurement variation. It also delivers measurement speeds of 0.9 ms, 2.1ms or 3.7 ms. The meter's accuracy improves test quality, while its measurement speed translates into fast test throughput.
The E4982A is compatible with the current industry-standard Agilent 4287A LCR meter, while offering greater performance. SCPI commands and handler interface function for the E4982A are compatible with the Agilent 4287A LCR meter as well, allowing customers to leverage their earlier investments and expertise in the software.
"The new E4982A LCR meter is really set apart from other commercially available solutions," said Akira Nukiyama, vice president and general manager of Agilent's Component Test Division, Japan. "Its features ensure manufacturers and system integrators fast, accurate impedance measurements while realizing improved test efficiency and a lower overall cost of test."
The E4982A LCR meter offers PC connectivity via GPIB, LAN and USB; an easy-to-use, intuitive user interface; a 10.4-inch display; and a compact design with 277-mm depth.
Agilent Technologies Inc., www.agilent.com
Company profile: Keysight Technologies
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2019|