Russian
News from Anritsu(88)
News from Fluke(23)
News from Keithley(28)
News from Keysight Technologies(232)
News from Metrel(0)
News from National Instruments(111)
News from Pendulum(14)
News from Rigol(2)
News from Rohde & Schwarz(169)
News from Tektronix(108)
News from Texas Instruments(47)
News from Yokogawa(24)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Advertisement

VIT Expo 2010

VIT Expo 2010

18.03.2010

International exhibition of machine vision, image processing and identification systems & technologies devoted to one of the most perspective innovative directions in the world of computer technologies — machine vision.

The innovative concept meets the high requirements of trade and professional visitors and offers a varied up-to-date and compact overview of products and solutions presented.

The B2B format of the show creates ideal conditions for meeting professionals in the field of machine vision technologies, its applications, systems and components.

Event Profile

Machine Vision & Imaging

Machine vision systems

  • application-specific machine vision systems,
  • configurable machine vision systems.

Applications

  • optical character recognition (OCR),
  • security systems,
  • 2D code identification,
  • bar code identification,
  • type recognition,
  • position identification,
  • sequence analysis,
  • quality inspection,
  • color inspection,
  • completeness check / assembly control,
  • print inspection,
  • texture analysis,
  • surface inspection of continuous material,
  • surface inspection of discrete parts,
  • inline robot vision,
  • 3D robot vision,
  • 2D robot vision,
  • shape recognition 3D,
  • measuring & comparing 3D,
  • measuring & comparing 2D.

Ñomponents & measuring systems

  • measuring systems for image processing,
  • measuring systems for machine vision,
  • cameras,
  • high speed cameras,
  • infrared cameras,
  • smart cameras,
  • area scan camera,
  • line scan camera,
  • optical sensors,
  • image sensors,
  • intelligent sensors,
  • software — application package,
  • software — library,
  • processors & computer components,
  • laser,
  • optics & illumination,
  • cables & plugs,
  • frame grabber hardware.

Services

  • technical & specialist literature,
  • design and development,
  • prototype development,
  • research & development,
  • training & consulting.

More information about the event available at http://www.rual-interex.ru/eng/


Start date:  04/27/2010
End date:  04/29/2010
Venue:  World Trade Center, Moscow, Russia
Organizer:  Rual Interex

Back to the list

Current issue
#6 December 2017
KIPiS 2017 #6
Topic of the issue:
Modern instrumentation
Search