National Instruments and Tektronix Announce Embedded Design Seminar
National Instruments and Tektronix Inc. announced open registration for the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar, a free half-day technical event that helps engineers increase efficiency in their embedded system design processes. Held from March 2 through May 18 in 11 cities, the seminar focuses on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.
"Tektronix and National Instruments have collaborated for many years to make design engineers' jobs easier," said Martyn Etherington, vice president of worldwide marketing at Tektronix. "We have worked hard to give engineers seamless integration between Tektronix oscilloscopes and LabVIEW to meet the advanced measurement and analysis requirements of embedded system designers. Now we’re coming together once again to show engineers just how effective our products are at dramatically increasing efficiency in the design lab."
The event features sessions from Tektronix and National Instruments that equip attendees with the knowledge and tools to speed their product design life cycles through effective debugging and verification. Attendees can gain insight from experts from both companies on how to efficiently test and verify their designs through precise serial bus decode measurements, instrument control, timing and power analysis and report generation. Additionally, engineers can learn best practices for scaling development efforts from design to test with hybrid test systems.
"This seminar will show engineers how they can simplify their work and significantly reduce product development cycles," said John Pasquarette, vice president of product marketing for software at National Instruments. "By integrating Tektronix instrumentation with LabVIEW and PXI for instrument control and test automation, design engineers can more quickly and easily analyze and visualize their data."
The seminar includes three sessions in which measurement experts from Tektronix and National Instruments explore in detail techniques for achieving efficiency gains. The presenters discuss the following concepts:
In addition, representatives from Tektronix and NI will be on hand to answer specific questions.
The seminar will take place in the following cities on the corresponding dates:
Readers can register for this free seminar and review the full agenda by visiting www.nitekseminar.com
National Instruments (www.ni.com)
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