News & Events
Companies' news
Trade fairs
RSS feeds
About us
Advertising info
Archives
Articles
Authors
Anniversary
Exhibition
History of metrology
Interview
Measurements in communication
Metrology
Modern instrumentation
New instrumentation
PC-based instruments
Reviews
Technical regulation
Books
My account
My profile
Newsletters
Companies´
news
Companies´
profiles
(105)
(23)
(30)
(270)
(0)
(133)
(14)
(6)
(208)
(131)
(65)
(25)
Login
Login:
Password:
Remember me on this computer
Forgot your password?
Register
Newsletters
KIPiS news digest
Advertisement
Archives
Articles
Exhibition
The Review of the Exhibition «Mobile&Wireless»
It is a brief review of the International exhibition «MOBILE & WIRELESS» held in Moscow, 27-29.11.2007
Author(s):
Afonskaya, Tatiana
,
Zelenkova E.
Issue:
KIPiS 2008 #1
Read PDF:
Read
Back to the list
Related Information:
Companies' news
Sensor+Test 2016: Rohde & Schwarz showcases its strong oscilloscope portfolio, featuring R&S Scope Rider and R&S RTO2000
Rohde & Schwarz presents growing oscilloscope portfolio at embedded world 2015
Visit Tektronix at Aerospace Testing in Hamburg
EuMW 2010: Rohde & Schwarz expands its microwave T&M portfolio with innovative products up to 500 GHz
Tektronix invites to see its new products on IBC exhibition in Amsterdam
KIPiS articles
Synergy of two exhibitions — ElectronTechExpo and ExpoElectronica!
15th jubilee Forum «Precision measurements — The basis of quality and safety». On the threshold of global changes!
Embedded World 2019 — the world of embedded technologies in the heart of Europe
Three days of joint work: ExpoElectronica and ElectronTechExpo
CES exhibition — message from the future!
KIPiS News & Events
Global business drives growth at 5th CES Asia
The electronics of the future are smart, safe and secure. Final report on electronica 2018
Registration is now open for CES 2019!
CES Asia: Innovation at the Speed of 5G
The Global Stage for Innovation! CES 2018 will run next week already!
Trade fairs
Mobile World Congress - MWC19
ExpoElectronica 2019
ElectronTechExpo 2019
electronica 2018
DesignCon 2019
Current issue
#3 June 2019
Topic of the issue:
Metrology
Search
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2019
